SMART TEST SYSTEMS for automotive components - as individual as your products

System that allows developers to test fuel cell control systems based on SIMATIC S7 without requiring a real fuel cell. The test system is based on the Hardware-in-the-Loop-principle – the voltages of the fuel cell stack als well as all relevant environmental parameters are simulated.

The test environment combines the MCM-IntelliProbe modules for monitoring and simulating cell voltages with the I/O modules of the MCM productfamily. The latter simulate relevant environmental factors such as pressure, temperature or certain switching states and measure the output values of the control unit.

The test system verifies the freezing robustness of urea injection systems. It provides the necessary control of the injection systems in a connected climate chamber and the associated measurement technology.

Up to 12 test pieces can be connected to the test system. It does not matter if it is DUT with or without EDU (Electronic Dosing Unit). The system can control both types of devices under test. The selection of the test object is made via the user interface.

The test system is divided into two parts for six test pieces each. Such a unit is called a BANK. Each BANK is controlled by a control computer (MCM MainControl). Each examinee has its own, controllable power supply. Furthermore, each test specimen has its own hose heater. The test procedure is controlled by scripts.

The functional testers for durability testing of parking brake control devices typically consists of 6 slots (subracks). Each is an independent functional unit and has an internal ARM9-based process control computer, via an individual test sequences can be defined and carried out using the Lua scripting language.

An essential key component is the SMART own high-precision wheel speed simulation for mapping complex types of sensors. To operate ECU-specific I / O channels individually developed MCM-plug-in module is used. To reduce costs, a high-quality high-current constant is used and the power Power distributed over a server to the six samples. Due to its modular and autonomous structure of each Subracks these stand-alone can be used.

The diagnostic tester is much more in the OEM quality assurance for various automotive control devices and components in the powertrain, driver assistance, driver safety used. All resources of the tester (500 channels) are performed on a centralized test adapter interface with high contact service life on which the specimen-test adapters are connected via the quick-change mechanism. In the test adapter, the actual allocation of system resource occurs. The specimen itself is typically contacted via a needle bed adapter with separate Kipphebelmechanik. If another controller to be tested, the test adapter is changed and the appropriate software configuration loaded. This takes only a few minutes. Through an adapter detection mating between hardware and software is checked. The control computer contains no aware test system-specific hardware and can be easily exchanged.
If the complete control of the test sequences on PROVEtech:TA under a Basic-based scripting language. The software already includes an automatic script and version management of all Prüflingsvarianten- and equipment.
In order to solve customer queries faster a global remote access and remote maintenance has been established.

The functional testers for durability testing of ECUs in the area object detection - Driver Assistance consists of 4 slots (Subracks). With each insertion two specimens can be served. Each is an independent functional unit and has an internal ARM9-based process control computer, via an individual test sequences can be defined and carried out using the Lua scripting language.

To configure and to monitor the test rig also includes namely an industrial PC, however the subracks operate autonomously. An individual touch-screen user interface is used for configuring before test start and the monitoring of the measured data during the test cycles. Another key component is a custom-developed plug-in module for use MCM-ECU-specific I / O channels and a per candidate controllable low-power constant for starting individual test points. Due to its modular and autonomous structure of each Subracks these stand-alone can be used.

By functional testers for ABS ECUs individual function modules of control unit hardware can be tested. To this end, various simulation and measurement technology components from the MCM family of products are installed in the test system. Special loads can be connected via an additional load connector. If the built-in measurement and stimulation channels are not sufficient, additional modules can be upgraded.

A standalone ARM9-based process computer allows complete control of the test sequences using the scripting language LUA. These scripts are provided with basic knowledge of scripting easy to create MCM PROCESS Studio under the development environment. Made available prepared script modules that can be used in the endurance testing later.

The system consists of two modules. The power supply module and the measurement module. In supply module, the system is connected to the 230 V mains and provided the supply voltages for the measuring module.

In metrology module measuring channels of CVMpro-G4 MCM IntelliProbe are performed on secure terminals that provide the interface to the system under test. The Ethernet interface can be communicating with the measuring system. For a Modbus gateway is used, which assumes the implementation of system-side CAN on the user-side Modbus TCP protocol.

With the EOL tester functions of the ABS sensor and the associated sensor wheel are checked on a vehicle axle. The tester can be determined whether or not the air gap between the sensor and trigger wheel is too big or too small. With a suspension of a tester both axes can be checked.

The application of measurement technology within climate chambers makes high demands on the inserted components. The measurement modules (MCM IntelliProbe) and the process module (MCM-MasterModule) are housed in a heated aluminum body. This allows the reliable use of monitoring equipment at temperatures down to -40 °C. The internal heating thereby avoids the formation of condensation within the housing. To prevent the ingress of moisture from the outside, the whole system including all connectors is designed following the requirements of the tightness class IP65.
The system concept is modular to allow applications with up to 430 channels. The application of the MCM-MasterModule enables a monitoring of the individual cell voltages with sample rates up to 1000 sps full parallel. Applications with more than 400 channels can be scanned up to 500 sps. For the disclosure of the data, free configurable Ethernet, CAN and GPIO interfaces are included.

The key requirements for measurement technology in the field of test bench applications are optimized handling properties. The integration of the system within a test rig environment has to occur easily with respect to assembly and disassembly. Moreover, a large variability concerning the test samples to be examined is required. This is especially true in the field of functional mock-up interfaces (FMI).
In the implemented solution, the measurement modules (MCM-IntelliProbe) and the process module (MCM-MasterModule) are housed within a 19"-rack, which allows simple integration or removal. Thus, the cell voltage monitoring units (CVM) can be exchanged between the FMI in any order. The connection of the measuring lines occurs via HV-qualified connectors. Moreover, additional taps for HV-- and HV+-signals are present. A wide range of test samples can be connected with the cell voltage monitoring unit via the customized harnesses.
The manifold blocks for power supply and communication lines may be placed either at the system side walls or at the back. Concerning this topic, we can react flexibly to customer-specific requirements. The cell voltage monitor is therefore characterized by a test bench suitable, strictly customer-oriented technology.
The system concept is modular to allow applications with up to 430 channels. The application of the MCM-MasterModule enables a monitoring of the individual cell voltages with sample rates up to 1000 sps full parallel. Applications with more than 400 channels can be scanned up to 500 sps. For the disclosure of the data, free configurable Ethernet, CAN and GPIO interfaces are included.

By functional testers individual function modules of the ECU hardware and software are tested. For this purpose, different simulation and measurement components are built into the test system. If the complete control of the tester via the CAN bus.
In Tester a central power supply for the device under test is installed, which is both controlled manually via a potentiometer on the front panel or automatically using internal analog voltage input. The control of the supply relay (KL30, KL15) may also be manual or automatic. The integrated separation adapter signals can be separated in the laboratory or picked for measurement purposes. Special loads are connected directly via a load connector. About an additional, also independently mobile use fault simulation module (TCFS-BOX), the ECU signals automatically disconnected, shorted together or are connected to two fault paths. The potentials of the error paths can be freely selected.

By Befundungstester the mechanics of a convertible top is checked. For this, the hood is mounted on an apprenticeship. The soft top is closed and then measured electronically. The test program is just in front of where the gauges must be placed.

The MCM-LabCar is a flexible test system for testing the hardware and software of a control unit. For the software test, the environment of the control unit is simulated with the aid of the test system. The system is used in development-accompanying hardware function tests, system tests, production tests or in the diagnostics of field returns.

Due to the modular design, the test system can be easily adapted to later applications. This is done by installing additional test components.

Test system for development-accompanying hardware function tests or system tests on embedded automotive control units (ECUs).

The TCFS box is used for error simulation on control unit pins. It is usually used in conjunction with a test system.

Various errors can be applied to signals:

• Open
• Short circuit between pins
• Short circuit to Failrail 1 (eg BAT +)
• Short circuit to Failrail 2 (eg BAT-)

All signals which are applied to the connected test system can be subjected to these errors. In addition, further signals can be fed in via jacks on the front panel or permanently bridged.